JEDEC JESD311-A (R2009)

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This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make ‘effective input noise temperature measurements’. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.

Product Details

Published:

11/01/1981

Number of Pages:

20

File Size:

1 file , 550 KB